Latest Topics
- SUNNY TANG
- SX architecture
- SS Rotterdam
- Sabena
- SS Conte di Savoia
- ST-610 patrol vessel
- SPH MediaWorks Channel U
- SR programming language
- Sabey
- SSS-islands
Random Topics
SILC (semiconductors)
Summary
- Stress Induced Leakage Current is a leakage current due to material defects created by stress in the gate oxide of a MOSFET. This is a common term in semiconductor physics.
Soundex: S425 ( S42 S525 ) Metaphone: SLKSMKNTKTRS Reference |
Similar Topics
- Fab (semiconductors)
- Wide bandgap semiconductors
- International Technology Roadmap for Semiconductors
- SILC (protocol)
- SILC
Related Topics
- None
* This page is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "SILC (semiconductors)".